Screening for Plagiarism Policy

SIMANTECH Journal of Science and Technology is committed to maintaining the highest standards of academic integrity and originality. To uphold these standards, all submitted manuscripts undergo a rigorous plagiarism screening process.

Plagiarism Detection

  • Every manuscript submitted to the journal is checked using reputable plagiarism detection software to identify potential instances of plagiarism or duplicate publication.

  • Manuscripts found to have significant overlap with previously published work without proper citation or authorization will be rejected.

Definition of Plagiarism

Plagiarism includes, but is not limited to:

  • Copying text, data, images, or ideas from other sources without appropriate acknowledgment.

  • Submitting previously published work or parts thereof as new.

  • Self-plagiarism, where authors recycle their own previously published material without proper citation.

Consequences of Plagiarism

  • Manuscripts detected with plagiarism will be immediately rejected.

  • Authors may be blacklisted from submitting future manuscripts to the journal.

  • Serious cases may be reported to the authors' affiliated institutions or relevant authorities.

Author Responsibility

  • Authors must ensure that their work is original and properly cited.

  • It is the authors’ responsibility to avoid plagiarism in any form.

By submitting a manuscript to SIMANTECH Journal of Science and Technology, authors agree to comply with this policy and understand the consequences of unethical conduct.